FIB & DualBeam FIB
| FEI 830 DualBeam FIB The DualBeam XL830 FIB/SEM workstation`s SEM column provides 3-nm resolution from 1-30 kV. The electron column offers balanced-field, in-lens detection to give good topographical detail, down-hole | |
 | FEI Strata 201 FIB This FIB system is installed and is in good operational condition at our customer's lab in Taiwan. If you are interested in more details or would like to inspect the tool, please c |